03 خرداد 1403
ولي دلوجي

ولی دلوجی

مرتبه علمی: دانشیار
نشانی:
تحصیلات: دکترای تخصصی / فیزیک حالت جامد
تلفن: 0813339841
دانشکده: دانشکده علوم پایه

مشخصات پژوهش

عنوان
The Effect of Geometry Characterizations and Annealing Processing on Dissipation Electrical Energy in ZnO Films
نوع پژوهش مقاله چاپ شده
کلیدواژه‌ها
Annealing temperature, Energy loss functions , Fractal geometry , Optical properties , Zinc oxide films
سال
2019
مجله INTERNATIONAL JOURNAL OF THERMOPHYSICS
پژوهشگران ولی دلوجی

چکیده

In this paper, optical constants, surface topology, and fractal dimensions of zinc oxide films under different post-annealing temperatures from 400 °C to 600 °C especially were investigated near optical band gap of films so that the maximum value of fractal dimension belongs to film annealed at 500 °C with the value of 2.07. In addition, the relaxation time of dielectric were estimated using their high-frequency dielectric constant while optical band gap were calculated through the cross-point between the tangent of lower and higher values of the photon energy in the plot of relaxation timeenergy. The high-frequency dielectric constant has the maximum value of 21 for film annealed at 400 °C. It can be seen that the free carriers electric susceptibility of films near optical band gap were increased with temperature. Moreover, the film annealed at 400 °C has high dissipation factor.