08 خرداد 1403
ولي دلوجي

ولی دلوجی

مرتبه علمی: دانشیار
نشانی:
تحصیلات: دکترای تخصصی / فیزیک حالت جامد
تلفن: 0813339841
دانشکده: دانشکده علوم پایه

مشخصات پژوهش

عنوان
MWCNTs synthesized on Ni Cu NPs@ aC: H films: study of the dielectric relaxation time, the free carriers concentration and the dissipation factor with different Ni layers thickness
نوع پژوهش مقاله چاپ شده
کلیدواژه‌ها
The Ni layer thicknesses · The optical dissipation factor · The free carriers concentration · The free carriers energy loss
سال
2021
مجله OPTICAL AND QUANTUM ELECTRONICS
پژوهشگران ولی دلوجی

چکیده

In this paper, we reported the optical constants and dissipation electrical energy of MWCNTs synthesized on Cu-Ni nanoparticles in hydrogenated amorphous carbon with diferent Ni layer thicknesses using capacitance coupled radio frequency plasma enhanced chemical vapor deposition (RF-PECVD) system. It can be seen that the Multi-Walled Carbon Nanotubes, MWCNTs, synthesized have maximum value of the average diameters in flms deposited with 15 nm Ni layer thickness. With increase of Ni layer thickness, the dielectric relaxation time peaks nearly obtain a blue shift. The RBS spectra results shown that Ni nanoparticles successfully was presented in thin flms. Due to the maximum value of the trapping incident photons on flms surface, flms deposited with 5 nm Ni layer thickness have maximum value of the absorption edge. The values of the free carriers electric susceptibility, χc, in thin flms with 15 nm Ni layers thickness, for all range wavelengths, have maximum values and they were increased with increasing wavelength. Films deposited with 10 nm Ni layer thickness have the maximum value of dissipation factor