1403/10/07
ولی دلوجی

ولی دلوجی

مرتبه علمی: دانشیار
ارکید:
تحصیلات: دکترای تخصصی
اسکاپوس:
دانشکده: دانشکده علوم پایه
نشانی:
تلفن: 0813339841

مشخصات پژوهش

عنوان
بررسی تاثیر دمای بازپخت روی چگالی اپتیکی، توپوگرافی سطح الیههای اکسید روی و اکسید روی آالئیده با آلومینیوم
نوع پژوهش
مقاله ارائه شده
کلیدواژه‌ها
Fractal dimensions, Structural properties, Transverse size of nanoparticles, Surface topography of layers, Optical density
سال 1400
پژوهشگران ولی دلوجی

چکیده

In this study, the ZnO film and ZnO film doped with Al were deposited on glass substrates by radio frequency magnetron sputtering at room temperature, and then, they were annealed at 400, 500, and 600 C in Ar atmosphere. Topology and RMS roughness of films were determined by Atomic Force Microscopt Veeco-Auto probe. Images were acquired in non-contact mode over square areas of 1 with standard tipped CSC12 cantilever of 0.03 N/m nominal stiffness (Veeco). All measurements were made at room temperature. The lateral size values of nanoparticles at room temperature and at temperatures of 400, 500 and 600°C for zinc oxide film are 35.4, 22.59, 25.28, 28.27nm, respectively, as well as for zinc oxide film doped with aluminum are 11.24, 17.14, 8.47, 34.41nm, respectively