The using RF-magnetron sputtering, the Cu + X @ amorphous carbon hydrogenic films (X = 0, 5, 10 and 15 nm Ni layer) thin films that is; CuNiCH films, were deposited on glass substrates at room temperature. Considering that the sputtering process in the films accumulation stage is a completely random process, the configuration and number and diversity of the atoms and ions forming the films were also somewhat affected by this process. Therefor with consideration Nc = 4, Za = 2, Ne = 8, it can be seen that maximum value of coordination number β in these CuNiCH films to be was about 0.279. We found that CuCH films/or CuNiCH films with zero Ni layer, had maximum value of the penetration depths/or the skin depths in about of 380 nm. It can be seen that with increasing Ni layer thickness of films, the absorption edge in these films have a shifting behavior towards lower wavelength (blue-shift). The total range shifting of the absorption edge in these films was as a blue-shift from 2.05 to 2.015 eV. The CuNiCH films with 5 nm Ni have maximum value of optical density. Different linear fitting of ln (⍺) for films were obtained as y = Ax + B where 0.5
