1404/04/11
نادر قبادی

نادر قبادی

مرتبه علمی: دانشیار
ارکید:
تحصیلات: دکترای تخصصی
اسکاپوس:
دانشکده: دانشکده علوم پایه
نشانی:
تلفن:

مشخصات پژوهش

عنوان
Influence of sputtered time on the structural and optical characterization of Al‑doped ZnO thin films prepared by RF sputtering technique
نوع پژوهش
JournalPaper
کلیدواژه‌ها
AZO thin films · RF sputtering technique · Optical transmittance · Optical band gap · Transition index properties · Urbach energy · Refractive index · Derivation ineffective thickness method (DITM)
سال
2021
مجله OPTICAL AND QUANTUM ELECTRONICS
شناسه DOI
پژوهشگران Nader Ghobadi ، Ebrahim Gholami Hatam

چکیده

In this project, aluminum doped zinc oxide thin films were deposited on glass substrate by the RF sputtering technique. The consequence of sputtered time on the structural and optical characteristics was evaluated. The optical parameter values were determined by ultra violet visible spectroscopy that the nature of optical transitions reveals direct allowed transition for all AZO thin films. Also, some physical quantities such as the Urbach tail energy, refractive index (n) in the edge of absorption and dielectric constant (ε) were reported for the AZO thin films with various sputtered time. Derivation ineffective thickness method (DITM) was employed to the optical band gap determination and transition index without any presumption about transition natural. Time of reaction plays an essential role in controlling the